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Scanning Electron Microscope (SEM) and Microanalysis Laboratory

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INSTRUMENTS

  • Scanning Electron Microscope JEOL 6400, operating under high vacuum conditions (10-4 Pa) and up to 300.000 magnifications
  • Energy Dispersive X-Ray Microanalysis System (EDS) Oxford-INCA, with Si(Li) window-less detector and a friendly software
  • A vacuum evaporator JEOL JEE-4X for specimen preparation

 

POSSIBLE ANALYSES

  • Secondary electron images; the acquisition of secondary electron signal allows to obtain morphological information on the sample. The signal of secondary electron is collected by a scintillation detector 

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  • Backscattered electron images; the signal of backscattered electron is collected by a pair semiconductor detector to obtain topographic and compositional information. The compositional image shows the atomic number contrast of the specimen (as shown in the picture below).

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  • X-Ray detection by Si(Li) window-less detector. It is possible to have the following informations:
    • Qualitative analyses on different types of samples
    • Standardless semi-quantitative anlyses
    • Quantitative analyses after acquisition of international standard samples, consisting of  pure elements, simple oxides or simple silicate compositions
    • X-Ray maps to investigate element distribution on the investigated sample surface 
    • Analyses of element distribution along a line profile (linescan)

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FIELDS OF INTEREST

Mineralogy, Petrology, Paleontology, Micropalentology, Geology

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Cultural Heritage

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Applied Petrography, Engineering

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Biology, Chemistry

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Pharmacology

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Ultimo aggiornamento: 20/02/2017 14:46
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