Scanning Electron Microscope (SEM) and Microanalysis Laboratory - research laboratory

Attività

INSTRUMENTS

• Scanning Electron Microscope JEOL 6400, operating under high vacuum conditions (10^-4 Pa) and up to 300.000 magnifications
• Energy Dispersive X-Ray Microanalysis System (EDS) Oxford-INCA, with Si(Li) window-less detector and a friendly software
• A vacuum evaporator JEOL JEE-4X for specimen preparation

POSSIBLE ANALYSES

• Secondary electron images; the acquisition of secondary electron signal allows to obtain morphological information on the sample. The signal of secondary electron is collected by a scintillation detector 

• Backscattered electron images; the signal of backscattered electron is collected by a pair semiconductor detector to obtain topographic and compositional information. The compositional image shows the atomic number contrast of the specimen (as shown in the picture below).

• X-Ray detection by Si(Li) window-less detector. It is possible to have the following informations:
  • Qualitative analyses on different types of samples
  • Standardless semi-quantitative anlyses
  • Quantitative analyses after acquisition of international standard samples, consisting of  pure elements, simple oxides or simple silicate compositions
  • X-Ray maps to investigate element distribution on the investigated sample surface 
  • Analyses of element distribution along a line profile (linescan)

FIELDS OF INTEREST

Mineralogy, Petrology, Paleontology, Micropalentology, Geology

Cultural Heritage

Applied Petrography, Engineering

Biology, Chemistry

Pharmacology

Allegati

Laboratorio Microscopia Elettronica inglese SCVSA.pdf(1.1 MB)

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